Electronic Devices - MOS Capacitor

Helps you to understand the MOSCAP operations and C-V characteristics.

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Electronic Devices - MOS Capacitor

What You Will Learn!

  • Introduction of MOSCAP
  • What is ideal MOSCAP and different mode of operation
  • What is the threshold voltage and what is inversion charge of MOSCAP and it's equations
  • Characteristics of MOSCAP
  • Non-idealities of MOSCAP

Description

Welcome to our comprehensive MOSCAP (Metal-Oxide-Semiconductor Capacitor) course! This course is designed to provide you with an in-depth understanding of MOSCAP operation, capacitance-voltage (C-V) characteristics, equations for threshold voltage and inversion charge, as well as the non-idealities associated with MOSCAP devices.

In this course, we will cover the following key topics:

  1. Modes of MOSCAP Operation: We will start by exploring the different modes of MOSCAP operation, including accumulation, depletion, and inversion. You will gain insights into the behavior of the depletion region under various biasing conditions, and how it affects the overall performance of MOSCAP devices.

  2. Capacitance-Voltage (C-V) Characteristics: Understanding the C-V characteristics is crucial for MOSCAP characterization and analysis. We will delve into the relationship between the applied voltage and the resulting capacitance, discussing concepts such as flatband voltage, threshold voltage, voltage inversion regions, and their significance in device operation.

  3. Equations for Threshold Voltage and Inversion Charge: You will learn the mathematical equations used to calculate the threshold voltage and inversion charge in MOSCAP devices. We will cover the derivation of these equations and their application in determining device behavior. Additionally, we will explore the factors that influence threshold voltage and inversion charge, such as gate material, oxide thickness, and doping profiles.

  4. Non-Idealities in MOSCAPs: MOSCAP devices are subject to various non-idealities that can impact their performance. We will delve into non-ideal effects such as interface traps, oxide traps, leakage currents, and hysteresis, discussing their origins, consequences, and strategies for mitigation. Understanding these non-idealities is crucial for designing reliable and high-performance MOSCAP-based devices.

Who Should Attend!

  • This course is specially designed for GATE students

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Lectures

8

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